Atomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy.

Supporting Material Atomic Scale Variations of the Mechanical Response on 2D Materials Sensed by Non-Contact AFM

Effects of Fluid Environment Properties on the Nonlinear Vibrations of AFM Piezoelectric Microcantilevers

Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...

Sensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters

In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...

Effective Parameters in Contact Mechanic for Micro/nano Particle Manipulation Based on Atomic Force Microscopy

The effect of geometry and material of the Micro/Nano particle on contact mechanic for manipulation was studied in this work based on atomic force microscopy. Hertz contact model simulation for EpH biological micro particle with spherical, cylindrical, and circular crowned roller shape was used to investigate the effect of geometry on contact simulation process in manipulation. Then, to val...

Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization.

We introduce a new type of microscopy which is capable of investigating surface topography and electrical property of conductive and dielectric materials simultaneously on a nanometer scale. The microwave atomic force microscopy is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. As a result, under the noncontact AFM working conditions, w...